Semiconductor chips of all types and functionalities benefit from socket testing to identify defects, malfunctions, or performance issues early in design or manufacturing. Chip testing reduces design cycles and ensures chips meet their design specifications and quality standards and perform reliably across diverse conditions.
For instance, semiconductor chips involved in memory/data storage and logic/processing, such as DRAM, NAND Flash, ASICs, GPUs, and CPUs, undergo socket testing. Yet the specific testing approach, whether batch or 100%, varies depending on the chip’s criticality, intended application, and production volume. Regardless of the testing method, socket testing is a vital step in verifying the function and quality of these chips before they are integrated into electronic devices.
